Monday, 11 April |
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5:00 - 8:00 PM | Registration/Reception | |
5:00 - 9:00 PM | Industrial Exhibit Setup | |
Tuesday, 12 April |
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7:30 - 8:30 AM | Continental Breakfast | |
8:30 AM | V. Ferlet-Cavrois | Welcome and Local Arrangements |
8:35 AM | N. Haddad | Introduction to Technical Program |
Invited Talk |
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8:40 AM | Reno Harboe Sørensen | 40 years of SEE at ESA/ESTEC |
9:00 AM - 9:00 PM | Industrial Exhibits Open | |
Session A: Design and Process Hardening |
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Chair: K. Avery, AFRL/RVSE |
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9:30 AM | D. F. Heidel, IBM Corp. | SEU Hardened SOI Latches |
9:50 AM | R. W. Blaine, Vanderbilt University | A RHBD Bootstrap Current Source Utilizing Sensitive Node Active Charge Cancellation (SNACC) |
10:10 AM | N. M. Atkinson, Vanderbilt University | Design Technique for Mitigation of Soft Errors in Transmission-Gate-Based Switched-Capacitor |
10:30 - 11:00 AM | Break | |
11:00 AM | V. Bratov, ADSANTEC | I2C Digital Interface Block Based on a 130nm Radiation-Hardened CMOS Library |
11:20 AM | P. Maillard, Vanderbilt University | A Radiation-Hardened Delay-Locked Loop Design Utilizing Differential Delay Line Topology |
11:40 AM | P. Obiomon, Prairie View A&M Univ. | Layout Guidelines to Minimize Latchup in CMOS Circuits Using Guard Rings |
12:00 - 1:00 PM | Lunch | |
Invited Talk |
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1:10 PM | Jeff Titus, NSWC-Crane | Update Perspective of SEB and SEGR in Power MOSFETs (tentative title) |
Session B: Destructive Single-Event Effects |
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Chair: R. Harboe Sørensen, ESA-Ret. |
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1:50 PM | T. R. Oldham, Dell-Perot Government Systems / NASA GSFC | Investigation of Current Spike Phenomena During Heavy Ion Irradiation in NAND Flash Memories |
2:10 PM | S. Liu, International Rectifier | Effects of Ion Species on SEB Failure Voltage of Power DMOSFET |
2:30 PM | R. L. Ladbury, NASA/GSFC | Challenges of Rate Estimation for Destructive and Disruptive Single-Event Effects |
2:50 - 3:20 PM | Break | |
Open Forum Panel Discussion |
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Moderator: P. McNulty, Clemson University |
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3:20 PM - ?? | Destructive Event Signatures in Flash Memories | NASA/GSFC, NASA/JPL-Caltech, ESA/ESTEC, University of Padova |
5:30 - 9:00 PM | Reception and Industrial Exhibits | |
5:30 - 6:30 PM | Cocktails and Appetizers | |
6:30 - 9:00 PM | Reception | |
9:00 - 11:00 PM | Teardown for Industrial Exhibits | |
Wednesday, 13 April
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7:30-8:30 AM | Continental Breakfast | |
Session C: Single-Event Transients |
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Chair: M. Gadlage, NWSC-Crane |
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8:30 AM | S. Buchner, Naval Research Laboratory | Comparison of Single Event Transients Generated by Pulsed Lasers at NRL, IMS, EADS and JPL |
8:50 AM | P. Eaton, Micro-RDC | NBTI as the True Cause for DSET Pulse Broadening |
9:10 AM | N. J. Gaspard, Vanderbilt University | Effect of Latchup Mitigation Techniques on Well Potential Modulation and Single-Event-Transient Pulse Widths |
9:30 AM | N. D. Pate, Vanderbilt University | Application of Scattering Parameter De-Embedding to the Reconstruction of Single Event Transients |
9:50 AM | H. Barnaby, Arizona State University | Analytical Model for Transient Radiation Effects in Floating Body SOI Transistors |
10:10 - 10:30 | Break | |
Invited Talk
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10:30 AM | Reed Lawrence, BAE Systems | Single Event Effect Considerations in Test Methods and Standards under Review at JEDEC Meetings |
Session D: Single-Event Test Methods |
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Chair: E. Cannon, Boeing |
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11:00 AM | M. R. Shaneyfelt, Sandia National Labs | SOI Substrate Removal for SEE Characterization: Techniques and Applications |
11:20 AM | R. Schwank, Sandia National Labs | Comparison of Single and Two-Photon Absorption for Laser Characterization of Single-Event Upsets in SOI SRAMs |
11:40 AM | S. Buchner, Naval Research Laboratory | Variable Depth Bragg Peak Method For Single Event Effects Testing |
12:00 - 1:00 PM | Lunch | |
Session D: Single-Event Test Methods (cont.) |
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Chair: W. Heidergott, General Dynamics |
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1:10 PM | D. McMorrow, Naval Research Laboratory | Single-Event Effects Induced by Two-Photon Absorption: Recent Results and Developments |
1:30 PM | M. P. King, Vanderbilt University | The Implications of Ion Track Structure for Single-Event Effect Analysis |
1:50 PM | V. Ferlet-Cavrois, ESA/ESTEC | Influence of beam conditions and energy for SEE testing of power MOSFETs, analog and digital components |
2:10 PM | J. A. Pellish, NASA/GSFC | Low-Energy Proton Testing Using Cyclotron Sources |
Session E: Product & Technology Evaluation |
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Chair: M. Shoga, Consultant |
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2:30 PM | K. Lilja, Robust Chip Inc. | Predictive Analysis, Comparisons, and Optimization of Single Event Soft Errors in Flip-Flops at 40nm and 28nm Technology Nodes |
2:50 PM | H. Puchner, Cypress Semiconductor | Comprehensive Radiation Study of a High Speed 72Mbit Quad Data Rate SRAM for Space Applications |
3:10 - 3:40 PM | Break | |
3:40 PM | S. Armstrong, NSWC-Crane/Vanderbilt University | Single-Event Vulnerability of Multi-Protocol, Multi-Feature Communications Devices |
4:00 PM | P. E. Dodd, Sandia National Labs | SEU Sensitivity and Distributions in CMOS Flip-Flops |
4:20 PM | P. McNulty, Clemson University | When Are Soft Errors Not Single-Event Effects? |
4:40 PM | S. Guertin, NASA/JPL-Caltech | Testing for Rare SEEs in Fault Tolerant Devices |
6:00 - 8:00 PM | Happy Hour | |
Thursday, April 14
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7:30 - 8:30 AM | Continental Breakfast | |
Session F: Single-Event Test Facilities |
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Chair: E. Cannon, Boeing |
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8:30 AM | V. Skuratov, Joint Institute for Nuclear Research | Roscosmos Ion Beam Line for SEE Testing at U400M FLNR JINR Cyclotron |
8:50 AM | G. R. Allen, NASA/JPL-Caltech | Current Status of the Jet Propulsion Laboratory’s Pulsed Laser Facility |
Session G: FPGAs |
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Chair: S. Rezgui, Microsemi |
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9:10 AM | M. D. Berg, MEI Technologies-NASA/GSFC | The Evaluation of Combinatorial Logic and Routing Affects to Single Event Transient Propagation in the Actel RTAXs FPGA |
9:30 AM | C. Carmichael, Xilinx Inc. | SEE Characterization and Recovery Mechanisms of MGTs in Space-grade Virtex-5 FPGAs |
9:50 AM | V. Liberali, University of Milano | Impact of Placement on SEU Sensitivity in SRAM-based FPGA |
10:10 - 10:30 AM | Break | |
10:30 AM | R. Monreal, Southwest Research Institute | Single-Event Characterization and Mitigation Techniques of DSPs Embedded in Space-Grade FPGAs |
10:50 AM | G. Swift, Xilinx Inc. | Techniques for Identifying SET Sources with Examples from Virtex-5QV Testing |
11:10 AM | S. Rezgui, Microsemi Corp. | First SEE Characterization of the Analog Block of the 0.13 μm Fusion Mixed-Signal Flash-Based FPGA |
11:30 AM | End of Technical Session | |
2:00 PM | Volleyball Session | Chair: Dale McMorrow, NRL |
General Chair: Veronique Ferlet-Cavrois, European Space Agency
Technical Program Chair: Nadim Haddad, BAE Systems
Local Arrangements & Industrial Exhibit Chairwoman: Penny Meeker, US-Semi Conductor Corporation
Treasurer: Bill Lotshaw, The Aerospace Corporation
Registration Services: Susan Hunt, Stamp Services
The Symposium is supported by the Defense Threat Reduction Agency, the NASA Electronic Parts and Packaging Program, The Aerospace Corporation, the Naval Research Laboratory, and Vanderbilt University.