SEE/MAPLD 2020 Banner

2021 SEE/MAPLD Abstract Submission is Open!

To submit an abstract to SEE/MAPLD, please fill out the fields below

Guidelines for Submissions:
Abstract submissions are a minimum of 1 and a maximum of 4 pages for MS Word

PowerPoint charts should provide a title page with authors and affiliations, motivation / context / overview, available relevant results, and anticipated conclusions.

The required file format is MS Word .docx or MS Powerpoint .pptx (refer to templates provided below)

MS Word DOCX abstract template (.docx)

MS Powerpoint PPTX abstract template (.pptx)
PDF versions of these .docx or .pptx templates are also accepted

After the submission due date, April 28th, 2021, the workshop committee will contact all authors by email
to indicate whether their presentation(s) have been accepted or declined

Abstract Title:
First Name:
Last Name:
E-mail Address:
Completed Abstract File:
*Select an appropriate session for your abstract:
(Refer to the table below)
Enter the code shown above:
SEE / MAPLD / Combined* Sessions
(*Exclusively for talks spanning both SEE and MAPLD tracks)
SEE Symposium MAPLD
New! Artificial Intelligence (AI) / Machine Learning (ML) in FPGAs/SoCs: AI / ML design considerations for reliable terrestrial, avionic, and aerospace applications; using AI for SEE mitigation; SEE evaluation of designs leveraging AI / ML
Phenomena: Upsets, Functional Interrupts, Transients, Latchup, Gate Rupture, Burnout, etc. FPGAs/SoCs, PLDs, and New Devices: New and/or novel FPGA and PLDs; Benchmarking of FPGAs and PLDs; Applications of space-borne processing.
Basic Mechanisms and Modeling: Destructive and Non-Destructive Effects, Nanoscale Phenomena, Charge Transport and Collection, Impact of Circuit and Environmental Parameters, etc. Mitigation of Single event effects in FPGAs/SoCs, PLDs, and commercial electronics: Multi-level approaches for high reliability and fault tolerance (redundancy, TMR, SET filtering, etc…), upset mitigation techniques and automated tools, etc.
SEE Mitigation Methods Including Radiation Hardened by Design (RHBD) and by Process (RHBP): Approaches for gaining SEE hardness in commercial devices, etc. Designing with FPGAs/SoCs, and PLDs: agile methods, ESL/HLS and model-based engineering techniques, embedded processing, and synthesis efficiency improvements.
Environments and Facilities: Space, Atmospheric and Terrestrial environments. Heavy Ion, Proton, Neutron and Pulsed Laser Test Facilities. Validation and Verification of FPGAs/SoCs, and PLDs: Verification techniques and languages such as co-simulation, System Verilog and OVM/UVM. Simulation speed-up techniques, emulation, new tools and methods for design validation.
Operational Regimes and Performance Data: Systems and Devices from LEO to Interplanetary, High Altitude Aircraft, and Terrestrial. Availability/Reliability/Susceptibility of programmable devices: Failure mechanisms, reliability testing and characterization, packaging reliability, reliable design practices.
Electronic & Photonic Device Data and Measurement Techniques: Memories, Analog/Digital Circuits, systems-on-chip (SoCs), Field Programmable Gate Arrays (FPGAs), Optocouplers, Photonic Integrated Circuits, Power Converters, Sensors, etc. Novel Applications and Case Studies: Reconfigurable computing, high-performance processing using programmable logic, successful deployment of programmable logic, etc.
Systems and Error Rate Computation: Error Mitigation, Error Detection & Correction, Multi-core Processing, and Fault Tolerant Systems; Analytic, Monte Carlo, Mixed-Level, methods, etc. Technical Management of FPGAs and PLDs: Technical leadership, process management and metrics.
Education: Education Practices, Market Demands for Military and Aerospace Component Engineers, and Engineer Retention.
Poster Session (SEE and MAPLD)
Material relevant to any of the above, both SEE and MAPLD, may be presented as a Poster
*All options subject to change any time, per the discretion of the conference committee

Registration and Industrial Exhibit Chairwoman: Teresa Farris, Archon, LLC.
Website Curator: Carl Szabo, AS and D, Inc. / GSFC