SEE Symposium / MAPLD 2013 Logo



Monday, April 8
5:00 PM - 8:00 PM Registration Reception
Tuesday, April 9
SEE Sessions Begin
8:40 AM Opening Remarks  
9:00 AM - 10:00 AM Invited Talk: AE9, AP9, and SPM: New models for radiation belt and space plasma specification Stu Huston
Atmospheric and Environmental Research, Inc.
10:00 AM - 10:30 AM Break  
  Session: Analog Single-Event Transients
Chair: Steve Buchner, NRL
10:30 AM - 10:50 AM Single Event Transient Testing of the Aeroflex Voltage Regulator Family Containing Linear Technologies Die Michael Campola and
Jonathan Pellish
10:50 AM - 11:10 AM Comparisons of Single Event Transients Produced by Short Pulsed X-rays, Lasers and Heavy Ion Testing David Cardoza
The Aerospace Corporation
11:10 AM - 11:30 AM Single Event Characterization of a 40nm Low Noise Amplifier Karen Freeman
Vanderbilt University
11:30 AM - 11:50 AM Investigation on Manufacturing Discrepancies Impact on TID-ASETs Synergistic Effect in LM124 Operational Amplifier Nicolas Roche
Naval Research Laboratory
11:50 AM - 12:10 PM First Measurements of Ion-induced Charge-Collection Transients in p-channel InGaSb FETs Jeffrey Warner
Naval Research Laboratory
12:10 PM - 1:40 PM Lunch  
  Session: Digital Single-Event Transients
Chair: Katherine Scott, Seakr
1:40 PM - 2:00 PM SET in high speed CAN transceivers Vyacheslav Korolev and
Vasily Anashin,
Joint-stock Company Institute of Space Device Engineering
2:00 PM - 2:20 PM Single-Event Transient (SET) Analysis of 40 nm Digital-controlled Oscillator (DCO) Topologies Paula Chen
Vanderbilt University
2:20 PM - 2:40 PM Generation and Characterization of 0.32 um FWHM Spot Size Ultraviolet Optical Pulses: Application to Single-Event Upset in CMOS SOI SRAMs Using Sub-Micrometer Spot Size Ultraviolet Optical Pulses Ani Khachatrian
Naval Research Laboratory
2:40 PM - 3:00 PM SET Pulse Width Trends in Highly Scaled SOI Rachel Quinn
Vanderbilt University
3:00 PM - 3:30 PM Fractional-Factorial Analysis of Single-Event Transient (SET) Pulse Widths Chundong Liang
Vanderbilt University
3:30 PM - 4:00 PM Break  
  Session: Destructive Single-Event Effects
Chair: Leif Scheick, JPL
4:00 PM - 4:20 PM Destructive Single-Event Failures in Diodes Megan Casey
4:20 PM - 4:40 PM Method for Bounding Destructive SEE Rates with Limited Statistics Ray Ladbury
4:40 PM End of Tuesday Sessions  
6:00 PM- 8:00 PM Happy Hour  
Wednesday, April 10
SEE Sessions Continue
  Session: Facilities and Test Methods
Chair: Dave Hansen, Maxwell
8:40 AM - 9:00 AM Chopper Wheel for Single Event Effect Testing of Low Bandwidth Microelectronic Devices with Short X-ray Pulses Stephen LaLumondiere
The Aerospace Corporation
9:00 AM - 9:20 AM Two-Photon-Absorption Induced Single-Event Effects (TPASEE): TPA Dosimetry Dale McMorrow
Naval Research Laboratory
9:20 AM - 9:40 AM On-Edge Irradiation of SOI Logic Cells Hardened by Spatial Redundancy Ethan Cannon
The Boeing Company
9:40 AM - 10:00 AM High energy (14-40 AMeV) ion beam-line for SEE Testing at U400M FLNR JINR Cyclotron Semen Mitrofanov
10:00 AM - 10:30 AM Break  
10:00 AM - 8:00 PM Industrial Exhibit  
  Session: Radiation Hardness and Assurance Methods
Chair: Bert Vemeire, Space Micro
10:30 AM - 10:50 AM A New Error Correction Circuit for Delay Locked Loops Pierre Maillard
Vanderbilt University
10:50 AM - 11:10 AM Comparison of the Variable-Depth Bragg-Peak Method for Single-Event Testing to Measured Values of LET Using Pulse Height Analysis Michael King
Vanderbilt University
11:10 AM - 11:30 AM Application of the Figure of Merit Method to Neutron-Induced Upset Rate Predictions for Sub-50 nm Devices Matthew Smith
11:30 AM - 11:50 AM Area Overhead Comparison of Various SEU Fault Tolerant Design Techniques Farouk Smith
Nelson Mandela Metropolitan University
11:50 AM - 1:20 PM Lunch  
  Session: Single-Event Upsets in Devices
Chair: Michael King, Vanderbilt University
1:20 PM - 1:40 PM ASIC SEU Rate Prediction in 45nm SOI CMOS Technology Andrew Kelly
BAE Systems
1:40 PM - 3:00 PM Side Session: SEE for Newcomers
The Single Event Envroment and the Physics of Single Event Effects

Steve Buchner, NRL
1:40 PM - 2:00 PM An Approach to Support the Use of Double Data Rate X Synchronous Dynamic Random Access Memory (DDRX SDRAM) Technology for High Reliability Space Systems Applications Lew Cohn
2:00 PM - 2:20 PM What Twenty Years of Solid-State Recorders Tells Us about the Next Twenty Ray Ladbury
2:20 PM - 3:00 PM An 18μW/MIPS, E-10 SEE/bit-day, Asynchronous Microcontroller Alain Martin
Situs Logic
3:00 PM - 3:30 PM Break  
3:30 PM - 4:30 PM Side Session: SEE for Newcomers cont.
Single event effects testing, mitigation, and lessons learned

Leif Scheick, JPL
  Session: Single-Event Upsets in Programmable Devices
Chair: Greg Allen, JPL
3:30 PM - 3:50 PM A Guideline for SEE Testing of SOCs Steven Guertin
3:50 PM - 4:10 PM Unanticipated Multiple Bit Upsets (MBUs) in Complex Designs and the Effects of Logic Masking Melanie Berg
MEI Technologies
4:10 PM - 4:30 PM Quantified Commercial NOR Flash SEE Qualification Results Craig Hafer
Aeroflex Colorado Springs
4:30 PM - 4:50 PM 72b-wide DDRII Module for FPGA Design and its Single-Event Effects Test Result Xiao Wang
4:50 PM End of Wednesday Sessions  
5:30 PM - 8:00 PM Industrial Exhibit Reception  
Thursday, April 11
SEE / MAPLD Combined + MAPLD Sessions Begin
  SEE/MAPLD Combined Session  
8:00 AM - 8:20AM MAPLD Introduction Tim Gallagher, Lockheed Martin
Mike Wirthlin, BYU
8:20 AM - 8:40 AM Upset Rate Estimate Analysis of the Digital Signal Processors in FPGAs Roberto Monreal
Southwest Research Institute
8:40 AM - 9:00 AM Approval Process for BME Capacitor Use in Xilinx FPGAs Doug Sheldon
9:00 AM - 9:20 AM NBTI-Driven Degradation of 45nm SOI PFET Array Edward Wyrwas
DfR Solutions, LLC.
9:20 AM - 9:40 AM Laser Testing of NASA SpaceCube Data Processing Kenneth Zick
9:40 AM - 10:00 AM Break  
9:40 AM - 1:00 PM Industrial Exhibit  
  MAPLD Session 1 - Applications and Reconfigurability
Chair: Keith Avery, AFRL
10:00 AM - 10:40 AM FPGA Use on Mars Science Laboratory Doug Sheldon
10:40 AM - 11:00 AM Sending real time video from the moon, SpaceIL Payload subsystem challenges and solutions Sandy Hefftz
11:00 AM - 11:20 AM Optimizing FPGA Performance, Power, and Dependability with Linear Programming Nicholas Wulf
11:20 AM - 11:40 AM FPGA-based Dynamically Reconfigurable Processing Module for the Solar Orbiter PHI Instrument Tobias Lange
IDA, TU Braunschweig
11:40 AM - 12:00 PM Dynamically Reconfigurable Hardware for Satellite Payload Processing Mario Porrmann
Bielefeld University
12:00 PM - 1:20 PM Lunch  
1:20 PM - 2:00 PM MAPLD Keynote Talk: The Forthcoming Renaissance in Reconfigurable Space Computing Dr. Alan George
  MAPLD Session 2 - SEE Testing and Mitigation
Chair: Keith Avery, AFRL
2:00 PM - 2:20 PM Reprogrammable SRAM based FPGAs in Space Applications - ESA initiatives to enable their safe use Jørgen Islstad
2:00 PM - 3:00 PM Side Session: FPGAs for Newcomers
What's All this Field Programmable Gate Array (FPGA) Stuff Have to Do With Space, Anyhow?

Melanie Berg, MEI Technologies
2:20 PM - 2:40 PM A CAD Flow for On-Line Testing and Patching Permanent Radiation Effects in Reconfigurable Systems Mario Porrmann
Bielefeld University
2:40 PM - 3:00 PM Results of the Proton Test Campaign on the RHBD Virtex-5QV FPGA Gary Swift
3:00 PM - 3:20 PM Break  
3:20 PM - 4:20 PM Side Session: FPGAs for Newcomers cont.
Intro to System-Level Mitigation and High-Level Languages for FPGA-Based Spaceborne Platforms

Tim Gallagher
Lockheed Martin
3:20 PM - 3:40 PM Modeling the Scrub Rate for SEC/DED BRAMs in FPGA Circuits Mike Wirthlin
3:40 PM - 4:00 PM Differentiating Scrub Rates between Space-Flight Applications and Accelerated Single Event Radiation Testing for SRAM based Field Programmable Gate Arrays Melanie Berg
MEI Technologies
4:00 PM - 4:20 PM SEE Susceptibility of Triple-Module Redundant (TMR) Schemes in FPGA Designs Roberto Monreal
Southwest Research Institute
4:20 PM - 4:40 PM Single Event Upset Mitigation for MGT-Based Aurora Protocol in a Radiation Environment Alex Harding
4:40 PM - 5:00 PM A Lightweight VHDL Implementation of a Xilinx V5-QV Self-Scrubber Chris Wojahn
5:00 PM End of Thursday Sessions  
Friday, April 12
MAPLD Sessions cont.
  MAPLD Session 2 - SEE Testing and Mitigation cont.
Chair: Jim Libous, Lockheed Martin
8:00 AM - 9:00AM FPGA SEE Test Guidelines Melanie Berg
MEI Technologies
9:00 AM - 9:20 AM SERET: A Tool for Weibull Curve Fitting and Space Error Rate Estimation Brent Nelson
  MAPLD Session 3 - Devices and Platforms
Chair: Jim Libous, Lockheed Martin
9:20 AM - 9:40 AM New Development of the 18-port SpaceWire Router Jennifer Larsen
9:40 AM - 10:00 AM Break  
10:00 AM - 10:20 AM Development of a Non-Volatile MRAM used to Boot a Xilinx Virtex-5 FPGA Jennifer Larsen
10:20 AM - 10:40 AM RC64: Programmable Many-Core for High Performance Space DSP Ofer Lapid
10:40 AM - 11:00 AM Microsemi Space FPGAs Qualification and Reliability Update Minh Nguyen
11:00 AM - 11:20 AM The Goddard Attached Payload System Daniel Espinosa
  MAPLD Session 4 - Design and Verification
Chair: Jim Libous, Lockheed Martin
11:20 AM - 11:40 AM Hybrid Platform for High Capacity FPGA Validation and Verification Jerry Kaczynski
11:40 AM - 12:00 PM Closing the Development Loop with Virtual Prototyping Michael Bradley
12:00 PM - 1:20 PM Lunch  
1:20 PM - 1:40 PM Static Formal Verification Methods and their application to military, satellite, and safety critical designs. David Landoll
1:40 PM - 2:00 PM No room for Error - How to Design Faster, Safer Implementation of High-Reliability, High-Availability Designs using FPGAs Doug Johnson
2:00 PM - 2:20 PM VHDL's OSVVM, The Death of SystemVerilog? Jim Lewis
2:20 PM - 2:40 PM UVM Made Easy - High-level Verification for Hardware Designers Jerry Kaczynski
2:40 PM - 3:00 PM VHDL-2008, The End of Verbosity Jim Lewis
3:00 PM - 3:20 PM Multigigahertz Parallel FFTs for FPGA and ASIC Implementation Doug Johnson
3:20 PM End of MAPLD Sessions / End of Conference  



General Chair(s): Peter McNulty, Clemson University (SEE) / Mythi To, Sandia National Laboratories (MAPLD)
Technical Program Chair(s): Leif Scheick, JPL (SEE) / Tim Gallagher, Lockheed Martin & Mike Wirthlin, Brigham Young University (MAPLD)
Industrial Exhibit Chairwoman: Teresa Farris, Aeroflex Corp.
Treasurer: Bill Lotshaw, The Aerospace Corporation
Local Arrangements & Registration Services: Susan Hunt, STAMP Services
SEE-MAPLD Steering Committee: Ken LaBel, NASA/GSFC; Jonathan Pellish, NASA/GSFC; Wes Powell, NASA/GSFC
Newcomers Sessions AV Support: Ken LaBel, NASA/GSFC

SEE Symposium and MAPLD are supported by the Aeroflex Corporation, the Aerospace Corporation, Brigham Young University, Lockheed Martin, the NASA Electronic Parts and Packaging Program, the Naval Research Laboratory, Sandia National Laboratories, and Vanderbilt University.