CRUX Flight Data Analysis

The Cosmic Ray Upsest Experiment (CRUX) is an electronic package launched in August, 1994 aboard the APEX spacecraft. This space experiment is designed to test the SEE characteristics of several types of RAM (256 Kbit and 1 Mbit) devices, as well as power MOSFETs. SEU data is available for RAM devices from Micron (both 256 Kbit and 1 Mbit), EDI (both 256 Kbit and 1 Mbit), Hitachi/Elmo (1 Mbit) and IDT (256 Kbit).

The paper (723KB pdf) Single Event Effects on Commercial Srams and Power MOSFETS: Final Results of the CRUX Flight Experiment on APEX by Janet Barth, et. al. summarizes the CRUX experiment on the APEX satellite.

The paper Single Event Effect Flight Data Analysis of Multiple NASA Spacecraft and Experiments; Implications to Spacecraft Electrical Designs by C.M. Seidleck, K.A. LaBel, et. al. investigates in-flight SEEs observed on CRUX, SAMPEX, and TOMS.

Flight data available:

RAM devices: Error Detection and Correction (EDAC) detects & records single and double bit errors

Data is available in 3 formats: a. SEU counts, b. Mercator projection at the same altitude as Sampex, and c. Mercator projection at the same altitudeas TOMS. Data is available for all 6 devices. A sample SEU count plot is available for the IDT 256 Kbit device, for August 11-18, 1994. (124k)

CRUX data is currently available for the following dates:
1994: August 11 through November 2
1995: January 8 through March 22
To have a look at specific data, please contact Christina Seidleck. She wrote the code & handles the data.

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Curator: Martha O'Bryan
Last Revised September 21, 2000
A service of the Radiation Effects and Analysis Group, Kenneth A. LaBel, Group Leader