An Insider's Guide to Designing Spacecraft Systems and Instruments for Operation in the Natural Space Radiation Environment

Acknowledgements

Abstract

Outline

Introduction

SOHO/LASCO C3
July 14, 2000

Radiation May Affect:

Spacecraft Design Reality

The Space Semiconductor Market - Reduced Options for Risk Avoidance

Increased Radiation Awareness -
Three Prime Technical Drivers

Sample Microelectronics Issue Affecting Spacecraft

The Natural Space Radiation Environment

Space Radiation Environment

Sun:
Dominates the Environment

Sunspot Cycle

Gradual Solar Events

Impulsive Solar Events

Solar Particle Events

Sunspot Cycle with Solar Proton Events

Solar Proton Event - October 1989

GCRs: Integral Linear Energy Transfer (LET) Spectra

Trapped Proton & Electron Intensities

SRAM Upset Rate on CRUX/APEX
South Atlantic Anomaly (SAA) and the Proton Belt

Solar Cycle Effects

Magnetic Storm and the
Electron Belts

Basic Radiation Effects

Radiation Effects and Spacecraft

Total Ionizing Dose

Displacement Damage Dose

Single Event Effects

Radiation Effects: The Root Cause in the Natural Radiation Environments

NASA and Radiation Requirements

NASA and Radiation Requirements

Radiation Device Regimes for the Natural Space Environment

NASA Missions

Mix of NASA Missions and
Radiation Requirements

Implications of NASA Mission Mix

Next Generation Space Telescope: Electronics Drivers

International Space Station:
Electronics Drivers

Space Shuttle: Electronics Drivers

Europa: Electronics Drivers

Radiation and Technology

Technology Triumvirate for
Insertion Into Spaceflight

NASA Technology Programs

Desirable Features for Future NASA
Missions - Factors Affecting Microelectronics

NASA Needs for
Microelectronics Technology

Sample Cost Factors for Selecting Commercial Versus Rad Hard Device

Microelectronics Technologies for NASA Roadmap - Breakthrough Bandwidth/Speed

Microelectronics Technologies for NASA Roadmap - Breakthrough Volume

Radiation Issues for Newer Technologies

Silicon on Insulator (SOI) Technology

Ultra-Low Power (ULP) Technology Microelectronics

GaAs Semiconductors

SiGe Semiconductors

InP Semiconductors

Wide Bandgap (WBG) Semiconductors

Fiber Optic System Applications

System Level Approach to Radiation Hardness Assurance (RHA)

Sensible Programmatics for Radiation Hardness Assurance (RHA):
A Two-Pronged Approach

Radiation and Systems Engineering:
A Rational Approach for Space Systems

Define the Hazard

Evaluate the Hazard

Define Requirements

System Requirements -
SEE Specifications

SEE - System Requirements (1 of 2)

SEE - System Requirements (2 of 2)

Single Event Effects Specification
(1 of 3)

Single Event Effects Specification
(2 of 3)

Single Event Effects Specification
(3 of 3)

Notes on System Requirements

The RDM Process

Radiation Design Margins
(RDMs) - 1 of 2

Radiation Design Margins
(RDMs) - 2 of 2

Evaluate Design/Component Usage

System Radiation Test
Requirements

Radiation Test Issues - Fidelity

Test Requirements - TID

Test Requirements - DDD

Test Requirements - SEE

“Engineer” with Designers

Iterate Process as Necessary

Mitigating Radiation Effects in Electronics

Radiation Risk Management:
Levels of Hardening

IC Hardening (1 of 2)

IC Hardening (2 of 2)

Circuit Hardening (1 of 2)

Circuit Hardening (2 of 2)

Mitigation of SEUs

Data SEUs - Sample Error Detection
and Correction (EDAC) Methods

SeaStar Flight Data
Recorders (FDRs) SEU Counts

Control SEUs - Sample
EDAC Schemes

Transient SEUs

Destructive Conditions - Mitigation

Discussion: Mission Implications

Ground-based Radiation Effects Research: Recent Highlights

SiGe Technology Flowdown - Technology Development

SiGe Technology Flowdown - Ground Test

SiGe Technology Flowdown - Tools

Detector Technology Flowdown - Technology Development

Detector Technology Flowdown - Ground Radiation Test

An APS Under Heavy Ion Irradiation

Detector Technology Flowdown - Tools

Fiber Optic Links (FOLs) - NASA Interest

Space Radiation Effects Issues
for Fiber Links

Metal Semiconductor Metal (MSM) Detectors

Vertical Cavity Surface
Emitting Laser (VCSELs)

VSCELs and MSMs Integrated
on a Single Substrate

Applications of VCSEL-Based
Smart Pixel Arrays

FOL - Result Highlights

FOL - FY01 and Beyond

Optocoupler Radiation Background

Optocoupler Radiation Assessment Approach and Results

Optocoupler Plans for FY01-FY02

Radiation Evaluation of COTS Microelectronics

COTS Microelectronics Results

COTS Plans for FY01-FY02

Final Comments

Radiation Resources at GSFC