Industrial Exhibit Info
2010 Single Event Effects Symposium PRELIMINARY CALL FOR PRESENTATIONS
This is the preliminary call for technical presentations for the 2010 Single Event Effects (SEE) Symposium. The SEE Symposium will be held at the San Diego Marriott La Jolla in La Jolla, CA April 12-14 2010. See Hotel Information Page.
We invite presentations addressing all aspects of SEE in microelectronic and photonic devices, circuits, and systems. Topics include (but are not limited to):
Phenomena
Upset, Transient, Latchup, Gate Rupture, Burnout, Destructive Effects in Bipolar Devices, Microdosimetric Effects, Multiple Event Upset, Dark Current, and Error Propagation.
Basic Mechanisms and Modeling
Destructive and Non-Destructive Effects, Nanoscale Phenomena, Effect of Operating Speed, Charge Transport and Collection, Impact of Circuit and Environmental Parameters, including temperature and aging.
SEE Mitigation Methods Including Hardened by Design (HBD) and by Process
Approaches for gaining SEE hardness in commercial devices.
Environments and Facilities
Space, Atmospheric and Terrestrial environments. Heavy Ion, Proton, Neutron and Laser Test Facilities.
Operational Regimes and Performance Data
Systems and Devices at LEO to Geosynchronous and Beyond, High Altitude Aircraft, and Terrestrial.
Electronic & Photonic Device Data
Memories, Latches, Analog Circuits, Microprocessors, FPGAs, Optocouplers, DC to DC Converters, Sensors, Commercial and Hardened Components.
Systems
Error Mitigation, Error Detection & Correction, Multi-core Processing, and Fault Tolerant Systems.
Special consideration will be given to complex device testing and effect analysis.
All interested personnel are invited to send a one-page abstract by February 19, 2010 to Jonathan Pellish, 2010 SEE Technical Program C0-Chair.. A voluntary submission to a Symposium Proceeding is also requested. Submissions may either be annotated charts or a short paper (up to but not more than 6 pages) based on the presentation. When submitting an abstract, please notify us of your publishing intent. The SEE Symposium will be unclassified and welcomes international participation. Authors are responsible for obtaining clearances to present their work.
Registration opens January 1, 2010.
Printable (pdf) version of 2010 SEE Symposium Call for Presentations.
Registration services will be provided by Stamp Services. Contact: Contact: Susan Hunt.
For information on having an Industrial Exhibit at the 2010 Single Events Effect Symposium: Industrial Exhibit Info.
the Naval Research Laboratory, and Vanderbilt University.
Symposium Chairman: Bill Lotshaw, The Aerospace Corporation
Technical Program Co-Chairs: Jonathan Pellish, NASA/GSFC
Local Arrangements & Industrial Exhibit Chairwoman : Penny Meeker, US-Semi Conductor Corporation
Treasurer: Steve Moss, The Aerospace Corporation
Registration Services: Susan Hunt, Stamp Services
Curator: Donna Cochran, NASA/GSFC
Last Revised October 20, 2009