Industrial Exhibit Info
2008 Single Event Effects Symposium PRELIMINARY CALL FOR PAPERS
This is the preliminary call for technical papers for the 2008 Single Event Effects (SEE) Symposium. The SEE Symposium will be held at the Renaissance Long Beach Hotel in Long Beach, CA April 15-17th 2008. See Hotel Information Page.
We invite papers addressing all aspects of SEE in microelectronic and photonic devices, circuits, and systems. Topics include (but are not limited to):
Phenomena
Upset, Transient, Latchup, Gate Rupture, Burnout, Destructive Effects in Bipolar Devices, Microdosimetric Effects, Multiple Event Upset, Dark Current, and Error Propagation.
Basic Mechanisms and Modeling
Destructive and Non-Destructive Effects, Nanoscale Phenomena, Effect of Operating Speed, Charge Transport and Collection, Impact of Circuit and Environmental Parameters.
SEE Mitigation Methods Including Hardened by Design (HBD) and by Process
Approaches for gaining SEE hardness in commercial devices.
Environments and Facilities
Space, Atmospheric and Terrestrial environments. Heavy Ion, Proton, Neutron and Laser Test Facilities.
Operational Regimes and Performance Data
Systems and Devices at LEO to Geosynchronous and Beyond, High Altitude Aircraft, and Terrestrial.
Electronic & Photonic Device Data
Memories, Latches, Analog Circuits, Microprocessors, FPGAs, Optocouplers, DC to DC Converters, Sensors, Commercial and Hardened Components.
Systems
Error Mitigation, Error Detection & Correction, and Multi-core Processing.
Special consideration will be given to complex device testing and effect analysis.
All interested personnel are invited to send a one-page abstract to Jeff Black by February 22, 2008. A voluntary submission to a Symposium Proceeding is also requested. Submissions may either be annotated charts or a short paper (up to but not more than 6 pages) based on the presentation. When submitting an abstract, please notify us of your publishing intent. The SEE Symposium will be unclassified and welcomes international participation. Authors are responsible for obtaining clearances to present their work.
The Symposium is supported by the Defense Threat Reduction Agency, the NASA Electronic Parts and Packaging Program, The Aerospace Corporation, and Vanderbilt University.
For information on having an Industrial Exhibit at the 2008 Single Events Effect Symposium: Industrial Exhibit Info
Treasurer : Steve Moss, The Aerospace Corporation
Registration Services: Susan Hunt, Stamp Services
Curator: Donna Cochran, NASA/GSFC
Last Revised January 9, 2008