The Single Event Effects (SEE) Symposium is dedicated towards the understanding of radiation-induced SEEs in microelectronics and photonics. SEEs occur when a single particle (neutron, proton or other heavy ion) interacts with the atoms that makeup a semiconductor. Some examples of these types of events are Single Event Upsets (SEU), Single Event Latchup (SEL), Single Event Gate Rupture (SEGR), Single Event Burnout (SEB), & others.

We invite papers addressing all aspects of SEE in microelectronics and photonic devices, circuits, and systems. Topics include (but are not limited to):

Phenomena

Upset, Transient, Latchup, Gate Rupture, Burnout, Destructive Effects in Bipolar Devices, Microdosimetric Effects, Multiple Event Upset, Dark Current, Error Propagation.

Basic Mechanisms and Modeling

Destructive and Non-Destructive Effects, Nanoscale Phenomena, Effect of Operating Speed, Charge Transport and Collection, Impact of Circuit and Environmental Parameters.

SEE Mitigation Methods Including Hardened by Design (HBD) and by Process

Approaches for gaining SEE hardness in commercial devices.

Environments and Facilities

Space, Atmospheric and Terrestrial environments. Heavy Ion, Proton, Neutron and Laser Test Facilities.

Operational Regimes and Performance Data

Systems and Devices at LEO to Geosynchronous and Beyond, High Altitude Aircraft, and Terrestrial.

Electronic & Photonic Device Data

Memories, Latches, Analog Circuits, Microprocessors, FPGAs, Optocouplers, DC to DC Converters, Sensors, Commercial and Hardened Components.

Systems

Error Mitigation, Error Detection & Correction, Multi-core Processing.


Special consideration will be given to complex device testing and effect analysis.


Registration services are provided by Stamp Services. Contact: Susan Hunt.



The Symposium is supported by the Defense Threat Reduction Agency, the NASA Electronic Parts and Packaging Program, The Aerospace Corporation, Vanderbilt University, and Boeing Corporation.

For information on having an Industrial Exhibit at the 2008 Single Events Effect Symposium: Industrial Exhibit Info